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70nm ultra-high resolution calibration standards (for AFM, SEM, Auger, and FIB)
70nm ultra-high resolution calibration standards (for AFM, SEM, Auger, and FIB)
Product details
stripe70nmSpacing, one-dimensional arrangement, accurate to ±0.25nmThere are two types: certified and uncertified. The spacing with certificates needs to refer to the actual numbers on the certificates. Accurate holographic stripes are suitable for ultra-high resolution microscopes（25kx-1000kx）Accurate calibration in the horizontal direction, as well as precise calibration of instruments at the nanoscale, and so on. Has high stability and high applicability characteristics.
Silicon wafer size:4×3×0.5mmPattern silicon dioxide manufacturing (ridge width)35nm, high35nmThis parameter is not calibrated.
There are two models of products provided:Model 70-1DandModel 70-1DUTCAmong themModel 70-1DCalibration standard sample,Certified by the manufacturer,Untraceable;Model 70-1DUTCCalibration standard sample,certification,traceable,Provide certificates（PTB,a German counterpart of NIST）.
Ordering information:
|
Item Number |
Product Name |
Specifications |
|
80127-1D |
Model 70-1D, Calibration standard, Unmounted |
a |
|
80127-1D-X |
Same as above, a sample table with pins can be provided; Or exclusively forAFMof15mmstainless steeldisk）； Or specify a sample stage |
a |
|
80127-1DC |
Model 70-1DUTCWith a certificate,Umounted |
a |
|
80127-1DC-X |
Same as above, a sample table with pins can be provided; Or exclusively forAFMof15mmstainless steeldisk）； Or specify a sample stage |
a |
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