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EDXRF energy dispersive X-ray fluorescence spectrometer
Product Overview: Energy Dispersive X-ray Fluorescence Spectrometer is an ideal choice for controlling product quality due to its small size, good sta
Product details
Product Overview
Energy dispersive X-ray fluorescence spectrometer is an ideal choice for controlling product quality due to its small size, good stability, fast and accurate analysis, low operating cost, convenient operation and maintenance. Can measure elements such as lead Pb, mercury Hg, cadmium Cd, chromium Cr, bromine Br, etc. Silicon semiconductor detectors achieve high sensitivity through intelligent excitation and detection design, and users can customize multi curve and multi spectral fitting and analysis methods, suitable for different application scenarios.
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Content description |
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Instrument model |
EDXRF |
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Analysis principle |
Energy dispersive X-ray fluorescence analysis method |
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Analyze the range of elements |
Na (11) - U (92) any element |
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Detection limit |
Cd/Hg/Br/Cr/Pb≤2 ppm |
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Sample shape |
Unlimited size, irregular shape |
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Sample Type |
Plastic/metal/film/powder/liquid, etc |
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X-ray tube |
target material |
Molybdenum (Mo) target |
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Tube voltage |
5─50KV |
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Tube current |
1─1000ｕA |
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Sample irradiation diameter |
2、5、8mm |
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detector |
Si PIN detector imported from the United States, high-speed pulse height analysis system |
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high voltage generator |
SPELLMAN High Voltage Generator from the United States |
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preamplifier |
US imported preamplifier with good compatibility with US imported detectors |
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Main amplifier |
Imported main amplifier from the United States, with good compatibility with imported detectors from the United States |
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AD conversion module |
Imported AD conversion module from the United States, with good compatibility with imported detectors from the United States |
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ADC |
2048 lanes |
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optical filter |
6 types of filters automatically selected and automatically switched |
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Sample observation |
1.3 million color CCD camera |
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analysis software |
Software product BX-V26 version, lifetime free upgrade |
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analytical method |
Theoretical alpha coefficient method, basic parameter method, empirical coefficient method |
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Operating system software |
WINDOWS XP (genuine) |
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data processing system |
host |
PC Business Models |
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CPU |
P4 3.0 |
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memory |
512MB |
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optical disc drive |
8xDVD |
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hard disk |
80G |
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monitor |
17 inch LCD display |
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working environment |
Temperature 10-35 ° C, humidity 30-70% RH |
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weight |
60Kg (main unit) |
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Overall dimensions |
550（W）×450(D)×450(H)mm |
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Requirements for external power supply |
AC220±10%、50/60Hz |
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Measurement conditions |
atmospheric environment |
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Test sample time |
100-300 seconds adjustable |
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ambient temperature |
10℃-28℃ |
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ambient humidity |
≤ 70% RH (25 ℃ room temperature) |
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Application field
EDXRF energy dispersive X-ray fluorescence spectrometer is applied in petrochemical products, plastics and polymers, food and cosmetics, environment, minerals, pharmaceuticals, building materials, central laboratory finished product inspection, metal materials, etc.
working principle
The principle used is X-ray fluorescence analysis, where each element in the excited sample emits secondary X-rays, and the secondary X-rays emitted by different elements have specific energy or wavelength characteristics. The detection system measures the energy and quantity of these emitted secondary X-rays. Then, the instrument software converts the information collected by the detection system into the types and contents of various elements in the sample.
Instrument structure
The accuracy of test data is fully guaranteed by integrating analysis methods such as empirical coefficient method and basic parameter method (FP method).
Empirical coefficient method: The instrument determines the influence coefficient based on the measurement of standard samples. High requirements for standard samples, similar to the type of sample to be tested, and simple calibration model.
Basic parameter method (FP method): The instrument determines parameters by modeling and calculating multiple physical quantities based on the actual detected substance. The requirements for standard samples are not high, the calculations are complex, and it is suitable for detecting substances that lack corresponding standard samples.
Software features
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The range of element content analysis is from 2 ppm to 99.99% |
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Adopting BG internal standard correction to improve the accuracy of non qualitative sample measurement |
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User defined multi curve and multispectral fitting analysis method |
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Fully automated quantitative analysis report is simple and accurate |
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Adaptive pilot calibration |
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Automatic acquisition and display of spectra. |
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It has the function of automatically detecting the working status of the instrument. |
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Automatic sample discrimination and analysis. Provide an extension interface for further analysis of other elements, from calcium to uranium. |
Imported hardware
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1 |
Si PIN detector imported from the United States, high-speed pulse height analysis system |
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2 |
SPELLMAN High Voltage Generator from the United States |
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3 |
US imported preamplifier with good compatibility with US imported detectors |
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4 |
Imported main amplifier from the United States, with good compatibility with imported detectors from the United States |
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5 |
Imported AD conversion module from the United States, with good compatibility with imported detectors from the United States |
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