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EM Kotter Veritas Tungsten Filament Scanning Electron Microscope Series
Product advantages: Large size sample analysis. The Veritas series can analyze large-sized samples that cannot be analyzed by conventional SEM
Product details
Product advantages- Analysis of large-sized samplesThe Veritas series can analyze large-sized samples that cannot be analyzed by conventional SEM. For example: wafers, disks
- Non destructive sample analysisSamples can be analyzed without cutting. For example, PCB and semiconductor pattern analysis
- Heavy sample analysisCapable of analyzing samples weighing up to 2kg. For example, rocks, iron ore
- Rapid sample analysisSimultaneously analyzing multiple samples greatly improves work efficiency and saves costs
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