Hangzhou Laihua Testing Instrument Co., Ltd
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    13388618590/13705359116
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    No. 32-36 Fanyuan Lane, Xiacheng District, Hangzhou City, Zhejiang Province (West of Wenhui Bridge; or exit from Exit A of "Datieguan" Station on Hangzhou Metro Line 1, heading south for 100 meters)
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LH-G800 Improved Metallographic Microscope
LH-G800 Improved Metallographic Microscope Main Features: ● Integrated with the latest advantages of metallographic microscope technology
Product details

The main features of LH-G800 improved metallographic microscope are:

By integrating the latest advantages of metallographic microscope technology, we provide customers with cost-effective metallographic analysis and industrial testing solutions with excellent imaging performance and comfortable operating experience. The LMPlan series long working distance metallographic objective lens improves the level of color difference correction, while adjusting the film system design to further enhance image resolution and color reproduction. Adopting an observation tube with the optimal comfortable angle (30 °) for newborn beds can alleviate users' tension and fatigue during prolonged work, ensuring optimal observation conditions. The scale on the observation tube facilitates users to adjust the optimal pupillary distance range by themselves. The falling light fixture adopts an LED Kola lighting system with a field of view aperture, aperture stop, and oblique lighting device; Preset polarizer, analyzer, and color filter slots.

Product Introduction

Configuration and Parameters

Product name and model CDM-806C/D Trinocular Translucent Metallographic Microscope
Component configuration and specifications Specification Description quantity
High eye point, large field of view, flat field eyepiece 23mm 1 pair
Infinite hinge three-way observation tube, tilted at 30 ° and rotated at 360 °;
Pupil distance adjustment range: 54mm to 75mm; Visual acuity adjustment ± 5 °; Two levels of spectral ratio R: T=100:0 or 50:50
1 set
Infinite long working distance flat field achromatic metallographic objective 5XLMPL5X/0.15 WD10.8mm 1 piece
Infinite long working distance flat field achromatic metallographic objective 10XLMPL10X/0.3 WD10mm 1 piece
Infinite working distance flat field achromatic metallographic objective 20XLMPL20X/0.45 WD4mm 1 piece
Infinite long working distance flat field semi destructive metallographic objective 50XLMPLFL50X/0.55 WD7.8mm 1 piece
Infinite long working distance flat field semi destructive metallographic objective 100XLMPLFL100X/0.80 WD2.1mm
(Can be equipped separately)
without
Internal positioning 5-hole converter 1 piece
Dual purpose rack with transparent and reflective features, featuring a low hand position coarse and micro coaxial focusing mechanism. Coarse adjustment stroke 28mm,
Equipped with a platform position up and down adjustment mechanism. The maximum sample height is 30mm, with a fine adjustment accuracy of 0.002mm.
Equipped with an adjustable elastic device to prevent slipping and a random upper limit device.
Built in 100-240VAC 50/60Hz wide voltage system, with independent and controllable upper and lower light sources.
1
Anti (falling) illumination device, Kola illumination system, with field aperture and aperture stop,
The center is adjustable. Equipped with oblique lighting device.
1
100-240V wide voltage, single high-power 5W LED, warm color 1
Single high-power 5W LED lamp room (for transmission) 1
Double layer mechanical mobile platform, with coaxial adjustment in the X and Y directions at low hand positions;
The platform area is 175mm × 145mm, and the movement range is 76mm × 42mm.
1
Reflective glass loading platform 1
Shake out achromatic spotlight (N.A 0.9) 1
φ 30 polarizing mirror insert board (for reflection) 1
360 degree rotating polarizer insert board 1
1/2CTV (0.5X), C interface, adjustable focus 1
magnification 50X、100X、200X、500X、 Adjustable (standard configuration 10X eyepiece)
light source Reflective LED lighting, transmissive LED lighting, adjustable brightness.
Note: CDM-806C: for computer type, CDM-806D: for digital camera type

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