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HR-SPM
Observing the vivid nano world
HR-SPM is a new generation atomic force microscope that uses frequency modulation. Not only can ultra-high resolution observation be achieved in atmospheric and liquid environments, but also the observation of the hydration and solvation layers at the solid-liquid interface has been achieved for the first time.
HR-SPM：High Resolution Scanning Probe Microscope
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●Adopting FM (frequency modulation) method The previous SPM (Scanning Probe Microscopy)/AFM (Atomic Force Microscopy) used AM (Amplitude Modulation) method, while FM (Frequency Modulation) method theoretically achieves higher resolution due to its high sensitivity detection. SPM：Scanning Probe Microseope |
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