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Transmission electron microscope calibration standard sample MAG * I * CAL
Transmission electron microscope calibration standard sample MAG * I * CAL
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This is the smallest ruler in the world! I have applied for the Guinness World Records! This unique calibration standard is directly traceable to the lattice constant of silicon crystals and can be used for three professional calibrations and corrections of all transmission electron microscopes:

l Magnification factor (full range)

l Camera constant

l Magnetic rotation angle between the image and diffraction pattern

Magnification calibration is the most common calibration in electron microscopy, as it is important to determine whether the magnification values displayed by the electron microscope itself or on the image are accurate, and how to correct them if they are inaccurate. With a uniqueMAG*I*CALBy calibrating the standard sample, you can approximately1000xto1,000,000xCalibrate the magnification of a transmission electron microscope across the entire range. Since the sample itself is a single crystal, it can also be used to measure camera constants and images/Calibrate the magnetic rotation angle of the diffraction pattern. althoughMAG*I*CALThe calibration standard sample is forTEMDeveloped for applications in the field of materials science, but equally useful in the field of life sciences.

MAG*I*CALThe reference standard for calibration is a silicon-based semiconductor multilayer cross-section that has been ion thinnedTEMSample. It contains4Group by5layer10nmthickSiGeAlloy layer and13nmA structure composed of thick pure silicon layers spaced apart from each other. Molecular beam epitaxy(MBE)High quality epitaxial layer grown by method as single crystal silicon001The strain layer on the substrate. such4The alternating structural layers (superlattice) areTEMImaging provides contrast between light and dark, and is made of silicon111The interplanar spacing is used as a measurement basis on a single crystal silicon substrate through high-resolution transmission electron microscopy(HREM)Directly calibrated, the calibration mark on the standard sample directly references a natural constant, which is the lattice constant of siliconMAG*I*CALIt can be fully traced back to a fundamental constant of nature.

Ordering information:

Item Number

Product Name

Specifications

80069

Transmission electron microscope calibration standard sampleMAG*I*CAL

a

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