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Instrument and meter
Array pressure sensing system
Liquid Particle Sizer - LPC
proximity aligner
Co series desktop plasma etching machine cleaning machine
ADR low-temperature constant temperature dry mK system
Precision glass cutting machine (desktop type)
Laser sampling
Electron microscope sample cleaning machine
Multi functional maskless laser direct writing
NX-HDM fully automatic defect detection atomic force microscope
Freeform Surface 3D Shape Tester
Desk V Thin Film Deposition Solution
BenchTop Turbo Thermal Evaporation and Sample Preparation
Wafer warpage stress measuring instrument
Hyperspectral microscope
Desktop Pro Thin Film Deposition - Magnetron Sputtering
Optical surface defect analyzer
NX Wafer Fully Automated Wafer Inspection Atomic Force Microscope
DV-502 Thermal Evaporation Thin Film Deposition
Explorer Electron Beam, Magnetron, Thermal Evaporation Thin Film Deposition
P17 automatic wafer probe profilometer/stair step meter
Internal stress detector
SERS chip substrate
Cathodic Fluorescence Imaging Spectral Detection System
NX-3DM Rotating Fully Automatic Atomic Force Microscope
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